Probenhalter für dünne Proben
Ideal um Querschnitte zu betrachten, wie Wafers, Schichten von Kondensatoren, Plastik, Metall usw.
Produktdetails
Beschreibung
Ideal for examination cross section of thin samples, such as wafers, multi-layer of capacitors, plastics, metals, etc.
- For most AMRAY: ½" diameter (12.7mm), 1/8" (3.1mm)dia. pin (3.1mm) with split openings up to ¼" (6.4mm). Available with either 8mm (5/16") pin height or 15mm (9/16") pin height.
- For ISI, JEOL, TOPCON: Double set screw for a secure holding of the specimen during observation. 15mm(9/16")(dia). x 10mm(3/8")(H), 6.4mm(1/4") split.
Weitere Informationen
Stiftdurchmesser |
3,1mm
|
---|---|
Kopfdurchmesser |
0-15mm
|
Kopfrand |
glatt
|
Verwendung mit |
Amray
|